29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
“I really enjoyed ESREF in Aalborg and was very pleased with all the arrangements and the overall logistical organization of the conference at this beautiful location. I should say it was a roaring success with a record number of submissions, exhibitors and a beautifully planned out program with adequate opportunities for technical interactions and social networking. I hope to attend ESREF more consistently in the years to come and look forward to more learning experiences there with different cultural connections to different parts of Europe!”
“I had a great time at ESREF 2018. I learned a lot from the technical talks especially on the GaN reliability. I got chance to network with many other researchers/engineers from academia and industries. The social event at Voergaard Castle was also very well organized, served with a great food and very entertaining shows. Overall, I can say ESREF 2018 was a great success. Congratulations to all the organizers! Looking forward to attend ESREF 2019”
Wardhana A. Sasangka (IPFA 2019 Technical Program Co-Chair/SMART, Singapore)
“It was excellent, from the content and from the organisation”
“Even if I think very hard I cannot come with any idea what could be improved at all”
“The catering was perfect”
Andreja Rojko, ECPE
“I really enjoyed taking part”
Stefan Oberhoff, Bosch
“Thank you for organizing the conference, I really enjoyed it very much!”
Daniel Beckmeier, Infineon
“Really, ESREF2018 was a great conference!”
Paolo Cova
“Indeed, it was a very interesting, and also very well organized, conference”
Paolo Mangone
“Very well organized ESREF conference”
Søren Jørgensen, Grundfos
“Thanks for organising the ESREF conference. It was a good one”
Jose Ortiz Gonzalez
“Thank you for this great conference. I enjoyed it a lot”
Shahriyar Kaboli
“You did a great job”
Giovanna Mura
“First keynote speaker is superb”
“Great presentations, good topics”
“The organisation was great”
Anonymous conference participants (on the 1st conference day)
“Highly interesting keynote from ITRS”
“The location has enough room for all the visitors”
“My favourite is the app”
Anonymous conference participants (on the 1st conference day)
“The food was good”
“Very interesting first day”
“Good overview of several subjects during tutorials”
Anonymous conference participants (on the 1st conference day)
“A nice event”
“Great opportunity to meet people from other countries and fields”
“It is very positive”
Anonymous conference participants (on the Young Professional Reception)
“Thanks to all the organization”
“Nice opportunity to network”
“I liked the setting”
Anonymous conference participants (on the Young Professional Reception)
“Very good”
“I have collected only positive experiences”
“Excellent”
Anonymous conference participants (on the 3rd conference day)
“It was my best dinner”
“Really it was a pleasure”
“The bus travel was greatly organised”
Anonymous conference participants (on the Gala Dinner)
“Interesting small stories around the castle”
“The location was wonderful”
“The idea with the historical touch was very entertaining”
Anonymous conference participants (on the Gala Dinner)
“Amazing!”
“Super fun!”
“Very nice!”
Anonymous conference participants (on the Gala Dinner)
“I really enjoyed the drinks, food and the best was maybe the organiser and the artists”
“A very nice, unique and original event – well done”
Anonymous conference participants (on the Gala Dinner)
Tutorial Lectures
Monday, October 1, 2018
Chairman: Tomislav Dragicevic
Gabriella Ghidini - STMicroelectronics SRL Dielectric Reliability in Microelectronics: a tight relationship between degradation and technology Details
Andreas Middendorf, Olaf Wittler - Fraunhofer IZM Reliability of packages for power devices Details
Matthias Lassmann - Infineon Moisture Modeling in Complex Systems Details
Peter de Place Rimmen - Danfoss Drives A/S Introduction to the modern Reliability based on physics and statistics Details
Thomas Detzel, Thomas Aichinger - Infineon Reliability of SiC and GaN power devices from the industrial perspective Details