Technical Program Committee
Technical Program Chairs
- M. CIAPPA - ETH Zurich, Switzerland
- P. COVA - University of Parma, Italy
- G. MENEGHESSO - University of Padua, Italy
Tracks in ESREF 2018
A - Quality and Reliability Assessment Techniques and Methods for Devices and Systems
- Ninoslav STOJADINOVIC - University of Nis, Serbia
- Cora SALM - UTwente, Netherland
B1 - Si-Technologies & Nanoelectronics: Hot Carriers, High-K, Gate Materials
- Gabriella GHIDINI - STMicroeectronics, Italy
- Alain BRAVAIX - ISEN-Toulon, France
B2 - Si Technologies & Nanoelectronics: Low-K, Cu Interconnects
- Eckhard LANGER - Globalfoundries, Germany
- Hervé JAOUEN - STMicroelectronics, France
B3 - Si-Technologies & Nanoelectronics: ESD, EMI and Latch-up
- Gianluca BOSELLI - TI, USA
- Marise BAFLEUR - LAAS, France
C - Progress in Failure Analysis: Defect Detection and Analysis
- Giovanna MURA - University of Cagliari, Italy
- Vladimir POPOK - Aalborg University, Denmark
D - Reliability of Microwave and Compound Semiconductors Devices
- Nathalie LABAT - IMS Bordeaux, France
- Michael DAMMANN - Fraunhofer IAF, Germany
E1 - Power Devices Reliability - Silicon and Passive
- Reinhold BAYERER - Infineon, Germany
- Huai WANG - Aalborg University, Denmark
E2 - Power Devices Reliability - Wide Bandgap Devices
- Matteo MENEGHINI - University of Padova, Italy
- Joachim WUERFL - FBH Germany
F - Packaging and Assembly Reliability
- Kirsten WEIDE-ZAAGE - Hannover University, Germany
- Rene RONGEN - NXP, Netherlands
G - MEMS, Sensors and Organic Electronics Reliability
- Fabio COCCETTI - FIALAB, France
- Stefan OBERHOFF - BOSCH, Germany
H - Photonics Reliability
- Massimo VANZI - University of Cagliari, Italy
- Alain BENSOUSSAN - IRT Saint Exupéry, France
I - Extreme Environments and Radiation
- Simone GERARDIN - Università di Padova, Italy
- Olivier CREPEL - Airbus, France
K - Renewable Energies Reliability
- Salvo LOMBARDO - IMM CNR, Italy
- Yongheng YANG - Alborg University, Denmark
L - Modeling for Reliability
- Luca SPONTON - Synopsys, Switzerland
- Susanna REGGIANI - University of Bologna, Italy
SS1 - Reliability in Traction Applications (Special Session)
- Zoubir KHATIR - IFSTTAR, France
- Hong LI - Beijing Jiaotong University, China