| INVITED SPEECH | ||
 | Mehdi B. Tahoori - Karlsruhe Institute of Technology Cross-Layer Approaches for Resilient VLSI System Design | |
| Abstract | ||
| As the minimum feature size continues to shrink, a host of vulnerabilities influence the resiliency of VLSI circuits, such as increased process variation as well as workload-dependent runtime variations due to voltage and thermal fluctuations together with various device and interconnect aging effects. Current approaches for variation-aware resilient circuit design consider only a small subset of these factors and typically address each of them in isolation. As a result, an over-pessimistic additive design margin, resulting from these sources, is eroding gains from technology scaling. In this talk I will discuss cross-layer approaches for holistic modeling of various variation effects in the design stack, by taking into account netlist, layout and workload to capture all spatial and temporal information, and also consider the interplay of various process and runtime variation effects. In addition, I will cover cross-layer variation-aware design optimization schemes. | ||
| Biography | ||
| Mehdi Tahoori is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany. He received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, in 2002 and 2003, respectively. In 2003, he was an Assistant Professor with the Department of Electrical and Computer Engineering, Northeastern University, where he became an Associate Professor in 2009. From August to December 2015, he was a visiting professor at VLSI Design and Education Center (VDEC), University of Tokyo, Japan. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology, and holds several US and European patents. He is currently the editor-in-chief of Microelectronic Reliability journal, associate editor for IEEE Design and Test Magazine, coordinating editor for Springer Journal of Electronic Testing (JETTA), and associate editor of IET Computers and Digital Techniques. He is the program chair of VLSI Test Symposium 2018 and General Chair of European Test Symposium 2019. Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award. He has received a number of best paper nominations and awards at various conferences and journals. | ||
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