29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


“I really enjoyed ESREF in Aalborg and was very pleased with all the arrangements and the overall logistical organization of the conference at this beautiful location. I should say it was a roaring success with a record number of submissions, exhibitors and a beautifully planned out program with adequate opportunities for technical interactions and social networking. I hope to attend ESREF more consistently in the years to come and look forward to more learning experiences there with different cultural connections to different parts of Europe!”

Nagarajan Raghavan (IPFA Co-Chair, SUTD, Singapore)



“I had a great time at ESREF 2018. I learned a lot from the technical talks especially on the GaN reliability. I got chance to network with many other researchers/engineers from academia and industries. The social event at Voergaard Castle was also very well organized, served with a great food and very entertaining shows. Overall, I can say ESREF 2018 was a great success. Congratulations to all the organizers! Looking forward to attend ESREF 2019”

Wardhana A. Sasangka (IPFA 2019 Technical Program Co-Chair/SMART, Singapore)



“It was excellent, from the content and from the organisation”

“Even if I think very hard I cannot come with any idea what could be improved at all”

“The catering was perfect”

Andreja Rojko, ECPE



“I really enjoyed taking part”

Stefan Oberhoff, Bosch

“Thank you for organizing the conference, I really enjoyed it very much!”

Daniel Beckmeier, Infineon



“Really, ESREF2018 was a great conference!”

Paolo Cova

“Indeed, it was a very interesting, and also very well organized, conference”

Paolo Mangone



“Very well organized ESREF conference”

Søren Jørgensen, Grundfos

“Thanks for organising the ESREF conference. It was a good one”

Jose Ortiz Gonzalez



“Thank you for this great conference. I enjoyed it a lot”

Shahriyar Kaboli

“You did a great job”

Giovanna Mura



“First keynote speaker is superb”

“Great presentations, good topics”

“The organisation was great”

Anonymous conference participants (on the 1st conference day)



“Highly interesting keynote from ITRS”

“The location has enough room for all the visitors”

“My favourite is the app”

Anonymous conference participants (on the 1st conference day)



“The food was good”

“Very interesting first day”

“Good overview of several subjects during tutorials”

Anonymous conference participants (on the 1st conference day)



“A nice event”

“Great opportunity to meet people from other countries and fields”

“It is very positive”

Anonymous conference participants (on the Young Professional Reception)



“Thanks to all the organization”

“Nice opportunity to network”

“I liked the setting”

Anonymous conference participants (on the Young Professional Reception)



“Very good”

“I have collected only positive experiences”

“Excellent”

Anonymous conference participants (on the 3rd conference day)



“It was my best dinner”

“Really it was a pleasure”

“The bus travel was greatly organised”

Anonymous conference participants (on the Gala Dinner)



“Interesting small stories around the castle”

“The location was wonderful”

“The idea with the historical touch was very entertaining”

Anonymous conference participants (on the Gala Dinner)



“Amazing!”

“Super fun!”

“Very nice!”

Anonymous conference participants (on the Gala Dinner)



“I really enjoyed the drinks, food and the best was maybe the organiser and the artists”

“A very nice, unique and original event – well done”

Anonymous conference participants (on the Gala Dinner)





Exhibitor



Booth 7
TePla GmbH


Description
PVA TePla Analytical Systems designs and manufactures state of the art Scanning Acoustic Microscopes. The company is owned by PVA TePla AG, a leading supplier of crystal growing systems for the semiconductor industry and photovoltaic applications. Technological developments have focused on the detection of structural defects and materials characterization within opaque materials. Scanning Acoustic Microscope (SAM) utilizes ultrasound to non-destructively examine surfaces and internal structures of a solid sample. Voids, inculsions, cracks and even density variations are alle defects sensitive tot he technique of acoustic microscopy. During the last 10 years our company introduced fully automated inline inspection SAMs for Si quality control, bonding inspection of MEMS, wafers and 3D integration products. PVA TePla operates an international sales and service network with own application laboratories in the US, Japan, Singapore and Malaysia. We cooperate with a large number of university facilities. Analytical Systems GmbH participates in a large number of funding projects and takes an active part in research and development in respect of ultrasound methodology and transducer development.
Our company is well known for its qualified personnel, high quality, short reaction times, customized solutions and years of experience. Our application engineers offer the most qualified know-how resource of SAM.
Our product range covers measurement and testing systems with ultrasound. In this case, our customers can choose from a large number of Scanning Acoustic Microscope as laboratory, semi-automated and fully automated systems. All systems can be customized to customers specific needs and requirements. Furthermore, all Scanning Acoustic Microscopes offer user-friendly application and structured user interface. Our measuring systems are equipped with transducers developed and manufactured in-house. Transducers from 3 to 2000 MHz are available for our systems. Specially adapted software, adjusted to our systems, offers the possibility to analyse samples in minute detail. In opposition to our competitors we distinguish ourselves from the competition by our long time experience in acoustic GHz-Microscopy which enables resolution below the 1 μm. The inclusion of multi-channel-scans permits a high troughput of samples and a shorter scantime. Our systems reduce your operating costs and become an important element in quality control of industry and semi-conductor business. The applications of SAM range from non-destructive examination of components in industry to analysis of medical and biological properties in opaque materials. Let yourself be convinced by our expertise and skills in Scanning Acoustic Microscopy.
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